The X-ray Diffraction (XRD) service is the reference analytical technique for the study of the mineralogical composition of a wide range of materials, organic and inorganic, natural and synthetic. Materials can be minerals, metals, ceramic, glass, plastic, drugs, paper among others. Samples may be in powder form, solid, tablets and thin films. The shape and size can be quite variable.

Application fields
Crystallography, mineralogy, organic and inorganic chemistry, analytical chemistry, geology, soil science, metallurgy, ceramics, pigments, pharmaceuticals, materials science, environmental science, archaeology, restoration of architectural, construction, mining and biotechnology, among others.

Service techniques

  • Crystalline phases identification
  • Crystalline structure determination
  • Polymorph determination
  • Impurities determination
  • Semi-quantitative and quantitative analysis of crystalline phases (and possibly of amorphous phases)
  • Clay analysis, with prior preparation of oriented aggregates.
  • Grazing Incidence X-ray Diffraction (GIXRD) analysis
  • Crystal structure refinement by Rietvel method

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Two fully functional diffractometers:

  • Bruker D8 Advance X-ray diffractometer is a θ-θ instrument, primary Göbel mirror (parallel beam geometry), with Cu anode, and SOL-X solid state (or scintillation counter) detector. It is used for routine identification of unknown materials and Grazing Incidence analysis. It is particularly suitable for the analysis of materials that emit fluorescence such as ferrous materials.
  • Bruker D8 Advance A25 X-ray diffractometer is a θ-θ instrument for powder samples analyses. This instrument is configured with a Cu x-ray tube, a number of slits and filters, with the possibility of switching between Bragg-Brentano geometry (beam focus) and Göbel mirror (parallel beam), a rotating sample holder, and a position sensitive LynxEyeXE detector. This instrument offers the option of turning the sample during the analysis and an automatic sample exchanger with 90 positions. It is used for routine identification of unknown materials, quantitative phase analysis and other applications.

Commonly used software

  • Diffracplus basic EVA
  • Diffracplus TOPAS
  • ICDD-PDF2 database

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